Can IOMeter specify specific data patterns under test?
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Can IOMeter specify specific data patterns under test?
by Hansen, Todd
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Hi,
I've got a question if it's possible within IOMeter to specify a specific data pattern to be used during I/O generation? I've been told that IOMeter has a way to dump the data it wrote so it can be compared to what is actually written to the drive. If
this is possible, how do you do this?
Thank-you,
Todd
Todd Hansen
Senior Test Engineer, Team Lead
ESG - Legacy Solutions Group, Special Projects
LSI Corporation
Engenio Storage Group
3718 N Rock Road, M/S AW013
Wichita, KS 67226-1397
316-636-8308 phone
"There are no more hours in a bad day than in a good one!" Unknown
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Re: Can IOMeter specify specific data patterns under test?
by ming zhang-2
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